3 #include <gtest/gtest.h>
12 struct ir_device *ir_dev;
14 class IRHalTest : public testing::Test
21 ret = hw_get_info(IR_HARDWARE_DEVICE_ID,
22 (const struct hw_info **)&info);
25 cout << "Fail to load ir hal(" << ret << ")" << endl;
30 cout << "Failed to open ir device; open(NULL)" << endl;
35 ret = info->open(info, NULL, (struct hw_common**)&ir_dev);
36 if (ret < 0 || !ir_dev) {
37 cout << "Failed to get ir device structure (" << ret << ")" << endl;
45 virtual void TearDown()
49 info = ir_dev->common.info;
53 info->close((struct hw_common *)ir_dev);
63 TEST_F(IRHalTest, InitP)
65 EXPECT_NE(ir_dev, nullptr);
68 TEST_F(IRHalTest, DeinitP)
70 struct ir_device *tmp;
74 hw_get_info(IR_HARDWARE_DEVICE_ID,
75 (const struct hw_info **)&info);
77 EXPECT_NE(info, nullptr);
78 EXPECT_NE(info->open, nullptr);
79 info->open(info, NULL, (struct hw_common**)&tmp);
81 ret = info->close((struct hw_common *)tmp);
85 TEST_F(IRHalTest, IsAvailableP)
89 EXPECT_NE(ir_dev, nullptr);
90 ir_dev->is_available(&val);
93 TEST_F(IRHalTest, TransmitP)
95 int pattern[5] = {100, 200, 300, 400, 500};
97 EXPECT_NE(ir_dev, nullptr);
98 ir_dev->transmit(pattern, 5);
101 int main(int argc, char **argv)
103 testing::InitGoogleTest(&argc, argv);
105 return RUN_ALL_TESTS();