test: log: Give tests names instead of numbers
[platform/kernel/u-boot.git] / test / dm / blk.c
1 // SPDX-License-Identifier: GPL-2.0+
2 /*
3  * Copyright (C) 2015 Google, Inc
4  */
5
6 #include <common.h>
7 #include <dm.h>
8 #include <part.h>
9 #include <usb.h>
10 #include <asm/state.h>
11 #include <dm/test.h>
12 #include <test/test.h>
13 #include <test/ut.h>
14
15 DECLARE_GLOBAL_DATA_PTR;
16
17 /* Test that block devices can be created */
18 static int dm_test_blk_base(struct unit_test_state *uts)
19 {
20         struct udevice *blk1, *blk3, *dev;
21
22         /* Make sure there are no block devices */
23         ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_BLK, 0, &dev));
24
25         /* Create two, one the parent of the other */
26         ut_assertok(blk_create_device(gd->dm_root, "sandbox_host_blk", "test",
27                                       IF_TYPE_HOST, 1, 512, 2, &blk1));
28         ut_assertok(blk_create_device(blk1, "sandbox_host_blk", "test",
29                                       IF_TYPE_HOST, 3, 512, 2, &blk3));
30
31         /* Check we can find them */
32         ut_asserteq(-ENODEV, blk_get_device(IF_TYPE_HOST, 0, &dev));
33         ut_assertok(blk_get_device(IF_TYPE_HOST, 1, &dev));
34         ut_asserteq_ptr(blk1, dev);
35         ut_assertok(blk_get_device(IF_TYPE_HOST, 3, &dev));
36         ut_asserteq_ptr(blk3, dev);
37
38         /* Check we can iterate */
39         ut_assertok(blk_first_device(IF_TYPE_HOST, &dev));
40         ut_asserteq_ptr(blk1, dev);
41         ut_assertok(blk_next_device(&dev));
42         ut_asserteq_ptr(blk3, dev);
43
44         return 0;
45 }
46 DM_TEST(dm_test_blk_base, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
47
48 static int count_blk_devices(void)
49 {
50         struct udevice *blk;
51         struct uclass *uc;
52         int count = 0;
53         int ret;
54
55         ret = uclass_get(UCLASS_BLK, &uc);
56         if (ret)
57                 return ret;
58
59         uclass_foreach_dev(blk, uc)
60                 count++;
61
62         return count;
63 }
64
65 /* Test that block devices work correctly with USB */
66 static int dm_test_blk_usb(struct unit_test_state *uts)
67 {
68         struct udevice *usb_dev, *dev;
69         struct blk_desc *dev_desc;
70
71         /* Get a flash device */
72         state_set_skip_delays(true);
73         ut_assertok(usb_init());
74         ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &usb_dev));
75         ut_assertok(blk_get_device_by_str("usb", "0", &dev_desc));
76
77         /* The parent should be a block device */
78         ut_assertok(blk_get_device(IF_TYPE_USB, 0, &dev));
79         ut_asserteq_ptr(usb_dev, dev_get_parent(dev));
80
81         /* Check we have one block device for each mass storage device */
82         ut_asserteq(6, count_blk_devices());
83
84         /* Now go around again, making sure the old devices were unbound */
85         ut_assertok(usb_stop());
86         ut_assertok(usb_init());
87         ut_asserteq(6, count_blk_devices());
88         ut_assertok(usb_stop());
89
90         return 0;
91 }
92 DM_TEST(dm_test_blk_usb, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
93
94 /* Test that we can find block devices without probing them */
95 static int dm_test_blk_find(struct unit_test_state *uts)
96 {
97         struct udevice *blk, *dev;
98
99         ut_assertok(blk_create_device(gd->dm_root, "sandbox_host_blk", "test",
100                                       IF_TYPE_HOST, 1, 512, 2, &blk));
101         ut_asserteq(-ENODEV, blk_find_device(IF_TYPE_HOST, 0, &dev));
102         ut_assertok(blk_find_device(IF_TYPE_HOST, 1, &dev));
103         ut_asserteq_ptr(blk, dev);
104         ut_asserteq(false, device_active(dev));
105
106         /* Now activate it */
107         ut_assertok(blk_get_device(IF_TYPE_HOST, 1, &dev));
108         ut_asserteq_ptr(blk, dev);
109         ut_asserteq(true, device_active(dev));
110
111         return 0;
112 }
113 DM_TEST(dm_test_blk_find, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
114
115 /* Test that block device numbering works as expected */
116 static int dm_test_blk_devnum(struct unit_test_state *uts)
117 {
118         struct udevice *dev, *mmc_dev, *parent;
119         int i;
120
121         /*
122          * Probe the devices, with the first one being probed last. This is the
123          * one with no alias / sequence numnber.
124          */
125         ut_assertok(uclass_get_device(UCLASS_MMC, 1, &dev));
126         ut_assertok(uclass_get_device(UCLASS_MMC, 2, &dev));
127         ut_assertok(uclass_get_device(UCLASS_MMC, 0, &dev));
128         for (i = 0; i < 3; i++) {
129                 struct blk_desc *desc;
130
131                 /* Check that the bblock device is attached */
132                 ut_assertok(uclass_get_device_by_seq(UCLASS_MMC, i, &mmc_dev));
133                 ut_assertok(blk_find_device(IF_TYPE_MMC, i, &dev));
134                 parent = dev_get_parent(dev);
135                 ut_asserteq_ptr(parent, mmc_dev);
136                 ut_asserteq(trailing_strtol(mmc_dev->name), i);
137
138                 /*
139                  * Check that the block device devnum matches its parent's
140                  * sequence number
141                  */
142                 desc = dev_get_uclass_platdata(dev);
143                 ut_asserteq(desc->devnum, i);
144         }
145
146         return 0;
147 }
148 DM_TEST(dm_test_blk_devnum, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
149
150 /* Test that we can get a block from its parent */
151 static int dm_test_blk_get_from_parent(struct unit_test_state *uts)
152 {
153         struct udevice *dev, *blk;
154
155         ut_assertok(uclass_get_device(UCLASS_MMC, 0, &dev));
156         ut_assertok(blk_get_from_parent(dev, &blk));
157
158         ut_assertok(uclass_get_device(UCLASS_I2C, 0, &dev));
159         ut_asserteq(-ENOTBLK, blk_get_from_parent(dev, &blk));
160
161         ut_assertok(uclass_get_device(UCLASS_GPIO, 0, &dev));
162         ut_asserteq(-ENODEV, blk_get_from_parent(dev, &blk));
163
164         return 0;
165 }
166 DM_TEST(dm_test_blk_get_from_parent, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);