test/dm/adc.c

   1 // SPDX-License-Identifier: GPL-2.0+
   2 /*
   3  * Tests for the driver model ADC API
   4  *
   5  * Copyright (c) 2015 Samsung Electronics
   6  * Przemyslaw Marczak <p.marczak@samsung.com>
   7  */
   8
   9 #include <common.h>
  10 #include <adc.h>
  11 #include <dm.h>
  12 #include <dm/root.h>
  13 #include <dm/util.h>
  14 #include <dm/test.h>
  15 #include <errno.h>
  16 #include <fdtdec.h>
  17 #include <power/regulator.h>
  18 #include <power/sandbox_pmic.h>
  19 #include <sandbox-adc.h>
  20 #include <test/test.h>
  21 #include <test/ut.h>
  22
  23 static int dm_test_adc_bind(struct unit_test_state *uts)
  24 {
  25         struct udevice *dev;
  26         unsigned int channel_mask;
  27
  28         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
  29         ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
  30
  31         ut_assertok(adc_channel_mask(dev, &channel_mask));
  32         ut_asserteq((1 << SANDBOX_ADC_CHANNELS) - 1, channel_mask);
  33
  34         return 0;
  35 }
  36 DM_TEST(dm_test_adc_bind, UT_TESTF_SCAN_FDT);
  37
  38 static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
  39 {
  40         struct udevice *dev;
  41
  42         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
  43         ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
  44
  45         return 0;
  46 }
  47 DM_TEST(dm_test_adc_wrong_channel_selection, UT_TESTF_SCAN_FDT);
  48
  49 static int dm_test_adc_supply(struct unit_test_state *uts)
  50 {
  51         struct udevice *supply;
  52         struct udevice *dev;
  53         int uV;
  54
  55         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
  56
  57         /* Test Vss value - predefined 0 uV */
  58         ut_assertok(adc_vss_value(dev, &uV));
  59         ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
  60
  61         /* Test Vdd initial value - buck2 */
  62         ut_assertok(adc_vdd_value(dev, &uV));
  63         ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
  64
  65         /* Change Vdd value - buck2 manual preset */
  66         ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
  67         ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
  68         ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
  69
  70         /* Update ADC platdata and get new Vdd value */
  71         ut_assertok(adc_vdd_value(dev, &uV));
  72         ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
  73
  74         /* Disable buck2 and test ADC supply enable function */
  75         ut_assertok(regulator_set_enable(supply, false));
  76         ut_asserteq(false, regulator_get_enable(supply));
  77         /* adc_start_channel() should enable the supply regulator */
  78         ut_assertok(adc_start_channel(dev, 0));
  79         ut_asserteq(true, regulator_get_enable(supply));
  80
  81         return 0;
  82 }
  83 DM_TEST(dm_test_adc_supply, UT_TESTF_SCAN_FDT);
  84
  85 struct adc_channel adc_channel_test_data[] = {
  86         { 0, SANDBOX_ADC_CHANNEL0_DATA },
  87         { 1, SANDBOX_ADC_CHANNEL1_DATA },
  88         { 2, SANDBOX_ADC_CHANNEL2_DATA },
  89         { 3, SANDBOX_ADC_CHANNEL3_DATA },
  90 };
  91
  92 static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
  93 {
  94         struct adc_channel *tdata = adc_channel_test_data;
  95         unsigned int i, data;
  96         struct udevice *dev;
  97
  98         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
  99         /* Test each ADC channel's value */
 100         for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
 101                 ut_assertok(adc_start_channel(dev, tdata->id));
 102                 ut_assertok(adc_channel_data(dev, tdata->id, &data));
 103                 ut_asserteq(tdata->data, data);
 104         }
 105
 106         return 0;
 107 }
 108 DM_TEST(dm_test_adc_single_channel_conversion, UT_TESTF_SCAN_FDT);
 109
 110 static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
 111 {
 112         struct adc_channel channels[SANDBOX_ADC_CHANNELS];
 113         struct udevice *dev;
 114         struct adc_channel *tdata = adc_channel_test_data;
 115         unsigned int i, channel_mask;
 116
 117         channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
 118                        ADC_CHANNEL(2) | ADC_CHANNEL(3);
 119
 120         /* Start multi channel conversion */
 121         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
 122         ut_assertok(adc_start_channels(dev, channel_mask));
 123         ut_assertok(adc_channels_data(dev, channel_mask, channels));
 124
 125         /* Compare the expected and returned conversion data. */
 126         for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
 127                 ut_asserteq(tdata->data, channels[i].data);
 128
 129         return 0;
 130 }
 131 DM_TEST(dm_test_adc_multi_channel_conversion, UT_TESTF_SCAN_FDT);
 132
 133 static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
 134 {
 135         struct adc_channel *tdata = adc_channel_test_data;
 136         unsigned int i, data;
 137
 138         for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
 139                 /* Start single channel conversion */
 140                 ut_assertok(adc_channel_single_shot("adc@0", tdata->id, &data));
 141                 /* Compare the expected and returned conversion data. */
 142                 ut_asserteq(tdata->data, data);
 143         }
 144
 145         return 0;
 146 }
 147 DM_TEST(dm_test_adc_single_channel_shot, UT_TESTF_SCAN_FDT);
 148
 149 static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
 150 {
 151         struct adc_channel channels[SANDBOX_ADC_CHANNELS];
 152         struct adc_channel *tdata = adc_channel_test_data;
 153         unsigned int i, channel_mask;
 154
 155         channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
 156                        ADC_CHANNEL(2) | ADC_CHANNEL(3);
 157
 158         /* Start single call and multi channel conversion */
 159         ut_assertok(adc_channels_single_shot("adc@0", channel_mask, channels));
 160
 161         /* Compare the expected and returned conversion data. */
 162         for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
 163                 ut_asserteq(tdata->data, channels[i].data);
 164
 165         return 0;
 166 }
 167 DM_TEST(dm_test_adc_multi_channel_shot, UT_TESTF_SCAN_FDT);
 168
 169 static const int dm_test_adc_uV_data[SANDBOX_ADC_CHANNELS] = {
 170         ((u64)SANDBOX_ADC_CHANNEL0_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
 171                 SANDBOX_ADC_DATA_MASK,
 172         ((u64)SANDBOX_ADC_CHANNEL1_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
 173                 SANDBOX_ADC_DATA_MASK,
 174         ((u64)SANDBOX_ADC_CHANNEL2_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
 175                 SANDBOX_ADC_DATA_MASK,
 176         ((u64)SANDBOX_ADC_CHANNEL3_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
 177                 SANDBOX_ADC_DATA_MASK,
 178 };
 179
 180 static int dm_test_adc_raw_to_uV(struct unit_test_state *uts)
 181 {
 182         struct adc_channel *tdata = adc_channel_test_data;
 183         unsigned int i, data;
 184         struct udevice *dev;
 185         int uV;
 186
 187         ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
 188         /* Test each ADC channel's value in microvolts */
 189         for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
 190                 ut_assertok(adc_start_channel(dev, tdata->id));
 191                 ut_assertok(adc_channel_data(dev, tdata->id, &data));
 192                 ut_assertok(adc_raw_to_uV(dev, data, &uV));
 193                 ut_asserteq(dm_test_adc_uV_data[i], uV);
 194         }
 195
 196         return 0;
 197 }
 198 DM_TEST(dm_test_adc_raw_to_uV, UT_TESTF_SCAN_FDT);