2 #include <dd-deviced.h>
4 static void startup(void);
5 static void cleanup(void);
7 void (*tet_startup)(void) = startup;
8 void (*tet_cleanup)(void) = cleanup;
10 static void utc_SystemFW_deviced_set_datetime_func_01(void);
11 static void utc_SystemFW_deviced_set_datetime_func_02(void);
14 POSITIVE_TC_IDX = 0x01,
18 struct tet_testlist tet_testlist[] = {
19 { utc_SystemFW_deviced_set_datetime_func_01, POSITIVE_TC_IDX },
20 { utc_SystemFW_deviced_set_datetime_func_02, NEGATIVE_TC_IDX },
24 static void startup(void)
28 static void cleanup(void)
33 * @brief Positive test case of deviced_set_datetime()
35 static void utc_SystemFW_deviced_set_datetime_func_01(void)
38 time_t timet = time(NULL);
40 ret_val = deviced_set_datetime(timet);
42 tet_infoline("deviced_set_datetime() failed in positive test case");
50 * @brief Negative test case of ug_init deviced_set_datetime()
52 static void utc_SystemFW_deviced_set_datetime_func_02(void)
56 r = deviced_set_datetime(NULL);
59 tet_infoline("deviced_set_datetime() failed in negative test case");