3 * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
5 * SPDX-License-Identifier: GPL-2.0+
12 * General observations:
13 * o The recommended test sequence is to test the data lines: if they are
14 * broken, nothing else will work properly. Then test the address
15 * lines. Finally, test the cells in the memory now that the test
16 * program knows that the address and data lines work properly.
17 * This sequence also helps isolate and identify what is faulty.
19 * o For the address line test, it is a good idea to use the base
20 * address of the lowest memory location, which causes a '1' bit to
21 * walk through a field of zeros on the address lines and the highest
22 * memory location, which causes a '0' bit to walk through a field of
23 * '1's on the address line.
25 * o Floating buses can fool memory tests if the test routine writes
26 * a value and then reads it back immediately. The problem is, the
27 * write will charge the residual capacitance on the data bus so the
28 * bus retains its state briefely. When the test program reads the
29 * value back immediately, the capacitance of the bus can allow it
30 * to read back what was written, even though the memory circuitry
31 * is broken. To avoid this, the test program should write a test
32 * pattern to the target location, write a different pattern elsewhere
33 * to charge the residual capacitance in a differnt manner, then read
34 * the target location back.
36 * o Always read the target location EXACTLY ONCE and save it in a local
37 * variable. The problem with reading the target location more than
38 * once is that the second and subsequent reads may work properly,
39 * resulting in a failed test that tells the poor technician that
40 * "Memory error at 00000000, wrote aaaaaaaa, read aaaaaaaa" which
41 * doesn't help him one bit and causes puzzled phone calls. Been there,
46 * This tests data lines for shorts and opens by forcing adjacent data
47 * to opposite states. Because the data lines could be routed in an
48 * arbitrary manner the must ensure test patterns ensure that every case
49 * is tested. By using the following series of binary patterns every
50 * combination of adjacent bits is test regardless of routing.
52 * ...101010101010101010101010
53 * ...110011001100110011001100
54 * ...111100001111000011110000
55 * ...111111110000000011111111
57 * Carrying this out, gives us six hex patterns as follows:
66 * To test for short and opens to other signals on our boards, we
67 * simply test with the 1's complemnt of the paterns as well, resulting
68 * in twelve patterns total.
70 * After writing a test pattern. a special pattern 0x0123456789ABCDEF is
71 * written to a different address in case the data lines are floating.
72 * Thus, if a byte lane fails, you will see part of the special
73 * pattern in that byte lane when the test runs. For example, if the
74 * xx__xxxxxxxxxxxx byte line fails, you will see aa23aaaaaaaaaaaa
75 * (for the 'a' test pattern).
79 * This function performs a test to verify that all the address lines
80 * hooked up to the RAM work properly. If there is an address line
81 * fault, it usually shows up as two different locations in the address
82 * map (related by the faulty address line) mapping to one physical
83 * memory storage location. The artifact that shows up is writing to
84 * the first location "changes" the second location.
86 * To test all address lines, we start with the given base address and
87 * xor the address with a '1' bit to flip one address line. For each
88 * test, we shift the '1' bit left to test the next address line.
90 * In the actual code, we start with address sizeof(ulong) since our
91 * test pattern we use is a ulong and thus, if we tried to test lower
92 * order address bits, it wouldn't work because our pattern would
95 * Example for a 4 bit address space with the base at 0000:
101 * Example for a 4 bit address space with the base at 0010:
104 * 0000 <- (below the base address, skipped)
108 * The test locations are successively tested to make sure that they are
109 * not "mirrored" onto the base address due to a faulty address line.
110 * Note that the base and each test location are related by one address
111 * line flipped. Note that the base address need not be all zeros.
115 * These tests verify RAM using sequential writes and reads
116 * to/from RAM. There are several test cases that use different patterns to
117 * verify RAM. Each test case fills a region of RAM with one pattern and
118 * then reads the region back and compares its contents with the pattern.
119 * The following patterns are used:
121 * 1a) zero pattern (0x00000000)
122 * 1b) negative pattern (0xffffffff)
123 * 1c) checkerboard pattern (0x55555555)
124 * 1d) checkerboard pattern (0xaaaaaaaa)
125 * 2) bit-flip pattern ((1 << (offset % 32))
126 * 3) address pattern (offset)
127 * 4) address pattern (~offset)
129 * Being run in normal mode, the test verifies only small 4Kb
130 * regions of RAM around each 1Mb boundary. For example, for 64Mb
131 * RAM the following areas are verified: 0x00000000-0x00000800,
132 * 0x000ff800-0x00100800, 0x001ff800-0x00200800, ..., 0x03fff800-
133 * 0x04000000. If the test is run in slow-test mode, it verifies
138 #include <watchdog.h>
140 #if CONFIG_POST & (CONFIG_SYS_POST_MEMORY | CONFIG_SYS_POST_MEM_REGIONS)
142 DECLARE_GLOBAL_DATA_PTR;
145 * Define INJECT_*_ERRORS for testing error detection in the presence of
148 #undef INJECT_DATA_ERRORS
149 #undef INJECT_ADDRESS_ERRORS
151 #ifdef INJECT_DATA_ERRORS
152 #warning "Injecting data line errors for testing purposes"
155 #ifdef INJECT_ADDRESS_ERRORS
156 #warning "Injecting address line errors for testing purposes"
161 * This function performs a double word move from the data at
162 * the source pointer to the location at the destination pointer.
163 * This is helpful for testing memory on processors which have a 64 bit
166 * On those PowerPC with FPU, use assembly and a floating point move:
167 * this does a 64 bit move.
169 * For other processors, let the compiler generate the best code it can.
171 static void move64(const unsigned long long *src, unsigned long long *dest)
177 * This is 64 bit wide test patterns. Note that they reside in ROM
178 * (which presumably works) and the tests write them to RAM which may
181 * The "otherpattern" is written to drive the data bus to values other
182 * than the test pattern. This is for detecting floating bus lines.
185 const static unsigned long long pattern[] = {
186 0xaaaaaaaaaaaaaaaaULL,
187 0xccccccccccccccccULL,
188 0xf0f0f0f0f0f0f0f0ULL,
189 0xff00ff00ff00ff00ULL,
190 0xffff0000ffff0000ULL,
191 0xffffffff00000000ULL,
192 0x00000000ffffffffULL,
193 0x0000ffff0000ffffULL,
194 0x00ff00ff00ff00ffULL,
195 0x0f0f0f0f0f0f0f0fULL,
196 0x3333333333333333ULL,
197 0x5555555555555555ULL
199 const unsigned long long otherpattern = 0x0123456789abcdefULL;
202 static int memory_post_dataline(unsigned long long * pmem)
204 unsigned long long temp64 = 0;
205 int num_patterns = ARRAY_SIZE(pattern);
207 unsigned int hi, lo, pathi, patlo;
210 for ( i = 0; i < num_patterns; i++) {
211 move64(&(pattern[i]), pmem++);
213 * Put a different pattern on the data lines: otherwise they
214 * may float long enough to read back what we wrote.
216 move64(&otherpattern, pmem--);
217 move64(pmem, &temp64);
219 #ifdef INJECT_DATA_ERRORS
220 temp64 ^= 0x00008000;
223 if (temp64 != pattern[i]){
224 pathi = (pattern[i]>>32) & 0xffffffff;
225 patlo = pattern[i] & 0xffffffff;
227 hi = (temp64>>32) & 0xffffffff;
228 lo = temp64 & 0xffffffff;
230 post_log("Memory (data line) error at %08x, "
231 "wrote %08x%08x, read %08x%08x !\n",
232 pmem, pathi, patlo, hi, lo);
239 static int memory_post_addrline(ulong *testaddr, ulong *base, ulong size)
247 end = (ulong *)((ulong)base + size); /* pointer arith! */
249 for(xor = sizeof(ulong); xor > 0; xor <<= 1) {
250 target = (ulong *)((ulong)testaddr ^ xor);
251 if((target >= base) && (target < end)) {
252 *testaddr = ~*target;
255 #ifdef INJECT_ADDRESS_ERRORS
256 if(xor == 0x00008000) {
257 readback = *testaddr;
260 if(readback == *testaddr) {
261 post_log("Memory (address line) error at %08x<->%08x, "
262 "XOR value %08x !\n",
263 testaddr, target, xor);
271 static int memory_post_test1(unsigned long start,
276 ulong *mem = (ulong *) start;
280 for (i = 0; i < size / sizeof (ulong); i++) {
286 for (i = 0; i < size / sizeof (ulong) && !ret; i++) {
288 if (readback != val) {
289 post_log("Memory error at %08x, "
290 "wrote %08x, read %08x !\n",
291 mem + i, val, readback);
303 static int memory_post_test2(unsigned long start, unsigned long size)
306 ulong *mem = (ulong *) start;
310 for (i = 0; i < size / sizeof (ulong); i++) {
311 mem[i] = 1 << (i % 32);
316 for (i = 0; i < size / sizeof (ulong) && !ret; i++) {
318 if (readback != (1 << (i % 32))) {
319 post_log("Memory error at %08x, "
320 "wrote %08x, read %08x !\n",
321 mem + i, 1 << (i % 32), readback);
333 static int memory_post_test3(unsigned long start, unsigned long size)
336 ulong *mem = (ulong *) start;
340 for (i = 0; i < size / sizeof (ulong); i++) {
346 for (i = 0; i < size / sizeof (ulong) && !ret; i++) {
349 post_log("Memory error at %08x, "
350 "wrote %08x, read %08x !\n",
351 mem + i, i, readback);
363 static int memory_post_test4(unsigned long start, unsigned long size)
366 ulong *mem = (ulong *) start;
370 for (i = 0; i < size / sizeof (ulong); i++) {
376 for (i = 0; i < size / sizeof (ulong) && !ret; i++) {
378 if (readback != ~i) {
379 post_log("Memory error at %08x, "
380 "wrote %08x, read %08x !\n",
381 mem + i, ~i, readback);
393 static int memory_post_test_lines(unsigned long start, unsigned long size)
397 ret = memory_post_dataline((unsigned long long *)start);
400 ret = memory_post_addrline((ulong *)start, (ulong *)start,
404 ret = memory_post_addrline((ulong *)(start+size-8),
405 (ulong *)start, size);
411 static int memory_post_test_patterns(unsigned long start, unsigned long size)
415 ret = memory_post_test1(start, size, 0x00000000);
418 ret = memory_post_test1(start, size, 0xffffffff);
421 ret = memory_post_test1(start, size, 0x55555555);
424 ret = memory_post_test1(start, size, 0xaaaaaaaa);
427 ret = memory_post_test2(start, size);
430 ret = memory_post_test3(start, size);
433 ret = memory_post_test4(start, size);
439 static int memory_post_test_regions(unsigned long start, unsigned long size)
444 for (i = 0; i < (size >> 20) && (!ret); i++) {
446 ret = memory_post_test_patterns(start + (i << 20),
449 ret = memory_post_test_patterns(start + (i << 20) +
456 static int memory_post_tests(unsigned long start, unsigned long size)
460 ret = memory_post_test_lines(start, size);
462 ret = memory_post_test_patterns(start, size);
468 * !! this is only valid, if you have contiguous memory banks !!
470 __attribute__((weak))
471 int arch_memory_test_prepare(u32 *vstart, u32 *size, phys_addr_t *phys_offset)
475 *vstart = CONFIG_SYS_SDRAM_BASE;
476 *size = (gd->ram_size >= 256 << 20 ?
477 256 << 20 : gd->ram_size) - (1 << 20);
479 /* Limit area to be tested with the board info struct */
480 if ((*vstart) + (*size) > (ulong)bd)
481 *size = (ulong)bd - *vstart;
486 __attribute__((weak))
487 int arch_memory_test_advance(u32 *vstart, u32 *size, phys_addr_t *phys_offset)
492 __attribute__((weak))
493 int arch_memory_test_cleanup(u32 *vstart, u32 *size, phys_addr_t *phys_offset)
498 __attribute__((weak))
499 void arch_memory_failure_handle(void)
504 int memory_regions_post_test(int flags)
507 phys_addr_t phys_offset = 0;
510 arch_memory_test_prepare(&vstart, &memsize, &phys_offset);
512 ret = memory_post_test_lines(vstart, memsize);
514 ret = memory_post_test_regions(vstart, memsize);
519 int memory_post_test(int flags)
522 phys_addr_t phys_offset = 0;
525 arch_memory_test_prepare(&vstart, &memsize, &phys_offset);
528 if (flags & POST_SLOWTEST) {
529 ret = memory_post_tests(vstart, memsize);
530 } else { /* POST_NORMAL */
531 ret = memory_post_test_regions(vstart, memsize);
534 !arch_memory_test_advance(&vstart, &memsize, &phys_offset));
536 arch_memory_test_cleanup(&vstart, &memsize, &phys_offset);
538 arch_memory_failure_handle();
543 #endif /* CONFIG_POST&(CONFIG_SYS_POST_MEMORY|CONFIG_SYS_POST_MEM_REGIONS) */