1 /* SPDX-License-Identifier: GPL-2.0+ */
3 * Copyright (c) 2013 Google, Inc.
10 #include <linux/bitops.h>
13 * struct unit_test_state - Entire state of test system
15 * @fail_count: Number of tests that failed
16 * @start: Store the starting mallinfo when doing leak test
17 * @of_live: true to use livetree if available, false to use flattree
18 * @of_root: Record of the livetree root node (used for setting up tests)
20 * @testdev: Test device
21 * @force_fail_alloc: Force all memory allocs to fail
22 * @skip_post_probe: Skip uclass post-probe processing
23 * @fdt_chksum: crc8 of the device tree contents
24 * @fdt_copy: Copy of the device tree
25 * @fdt_size: Size of the device-tree copy
26 * @other_fdt: Buffer for the other FDT (UT_TESTF_OTHER_FDT)
27 * @other_fdt_size: Size of the other FDT (UT_TESTF_OTHER_FDT)
28 * @of_other: Live tree for the other FDT
29 * @runs_per_test: Number of times to run each test (typically 1)
30 * @expect_str: Temporary string used to hold expected string value
31 * @actual_str: Temporary string used to hold actual string value
33 struct unit_test_state {
35 struct mallinfo start;
36 struct device_node *of_root;
39 struct udevice *testdev;
47 struct device_node *of_other;
53 /* Test flags for each test */
55 UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
56 UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
57 UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
58 UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
59 UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
60 UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
61 /* do extra driver model init and uninit */
63 UT_TESTF_OTHER_FDT = BIT(7), /* read in other device tree */
67 * struct unit_test - Information about a unit test
70 * @func: Function to call to perform test
71 * @flags: Flags indicated pre-conditions for test
76 int (*func)(struct unit_test_state *state);
81 * UNIT_TEST() - create linker generated list entry for unit a unit test
83 * The macro UNIT_TEST() is used to create a linker generated list entry. These
84 * list entries are enumerate tests that can be execute using the ut command.
85 * The list entries are used both by the implementation of the ut command as
86 * well as in a related Python test.
88 * For Python testing the subtests are collected in Python function
89 * generate_ut_subtest() by applying a regular expression to the lines of file
90 * u-boot.sym. The list entries have to follow strict naming conventions to be
91 * matched by the expression.
93 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
94 * foo that can be executed via command 'ut foo bar' and is implemented in
95 * function foo_test_bar().
97 * @_name: concatenation of name of the test suite, "_test_", and the name
99 * @_flags: an integer field that can be evaluated by the test suite
101 * @_suite: name of the test suite concatenated with "_test"
103 #define UNIT_TEST(_name, _flags, _suite) \
104 ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
111 /* Get the start of a list of unit tests for a particular suite */
112 #define UNIT_TEST_SUITE_START(_suite) \
113 ll_entry_start(struct unit_test, ut_ ## _suite)
114 #define UNIT_TEST_SUITE_COUNT(_suite) \
115 ll_entry_count(struct unit_test, ut_ ## _suite)
117 /* Use ! and ~ so that all tests will be sorted between these two values */
118 #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
119 #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
120 #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
122 /* Sizes for devres tests */
124 TEST_DEVRES_SIZE = 100,
125 TEST_DEVRES_COUNT = 10,
126 TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
128 /* A few different sizes */
129 TEST_DEVRES_SIZE2 = 15,
130 TEST_DEVRES_SIZE3 = 37,
134 * testbus_get_clear_removed() - Test function to obtain removed device
136 * This is used in testbus to find out which device was removed. Calling this
137 * function returns a pointer to the device and then clears it back to NULL, so
138 * that a future test can check it.
140 struct udevice *testbus_get_clear_removed(void);
142 #ifdef CONFIG_SANDBOX
143 #include <asm/state.h>
144 #include <asm/test.h>
147 static inline void arch_reset_for_test(void)
149 #ifdef CONFIG_SANDBOX
150 state_reset_for_test(state_get_current());
153 static inline int test_load_other_fdt(struct unit_test_state *uts)
156 #ifdef CONFIG_SANDBOX
157 ret = sandbox_load_other_fdt(&uts->other_fdt, &uts->other_fdt_size);
162 #endif /* __TEST_TEST_H */