1 /* SPDX-License-Identifier: GPL-2.0+ */
3 * Copyright (c) 2013 Google, Inc.
10 #include <linux/bitops.h>
13 * struct unit_test_state - Entire state of test system
15 * @fail_count: Number of tests that failed
16 * @start: Store the starting mallinfo when doing leak test
17 * @of_live: true to use livetree if available, false to use flattree
18 * @of_root: Record of the livetree root node (used for setting up tests)
20 * @testdev: Test device
21 * @force_fail_alloc: Force all memory allocs to fail
22 * @skip_post_probe: Skip uclass post-probe processing
23 * @expect_str: Temporary string used to hold expected string value
24 * @actual_str: Temporary string used to hold actual string value
26 struct unit_test_state {
28 struct mallinfo start;
29 struct device_node *of_root;
32 struct udevice *testdev;
39 /* Test flags for each test */
41 UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
42 UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
43 UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
44 UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
45 UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
46 UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
47 /* do extra driver model init and uninit */
52 * struct unit_test - Information about a unit test
55 * @func: Function to call to perform test
56 * @flags: Flags indicated pre-conditions for test
61 int (*func)(struct unit_test_state *state);
66 * UNIT_TEST() - create linker generated list entry for unit a unit test
68 * The macro UNIT_TEST() is used to create a linker generated list entry. These
69 * list entries are enumerate tests that can be execute using the ut command.
70 * The list entries are used both by the implementation of the ut command as
71 * well as in a related Python test.
73 * For Python testing the subtests are collected in Python function
74 * generate_ut_subtest() by applying a regular expression to the lines of file
75 * u-boot.sym. The list entries have to follow strict naming conventions to be
76 * matched by the expression.
78 * Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
79 * foo that can be executed via command 'ut foo bar' and is implemented in
80 * function foo_test_bar().
82 * @_name: concatenation of name of the test suite, "_test_", and the name
84 * @_flags: an integer field that can be evaluated by the test suite
86 * @_suite: name of the test suite concatenated with "_test"
88 #define UNIT_TEST(_name, _flags, _suite) \
89 ll_entry_declare(struct unit_test, _name, ut_ ## _suite) = { \
96 /* Get the start of a list of unit tests for a particular suite */
97 #define UNIT_TEST_SUITE_START(_suite) \
98 ll_entry_start(struct unit_test, ut_ ## _suite)
99 #define UNIT_TEST_SUITE_COUNT(_suite) \
100 ll_entry_count(struct unit_test, ut_ ## _suite)
102 /* Use ! and ~ so that all tests will be sorted between these two values */
103 #define UNIT_TEST_ALL_START() ll_entry_start(struct unit_test, ut_!)
104 #define UNIT_TEST_ALL_END() ll_entry_start(struct unit_test, ut_~)
105 #define UNIT_TEST_ALL_COUNT() (UNIT_TEST_ALL_END() - UNIT_TEST_ALL_START())
107 /* Sizes for devres tests */
109 TEST_DEVRES_SIZE = 100,
110 TEST_DEVRES_COUNT = 10,
111 TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
113 /* A few different sizes */
114 TEST_DEVRES_SIZE2 = 15,
115 TEST_DEVRES_SIZE3 = 37,
119 * testbus_get_clear_removed() - Test function to obtain removed device
121 * This is used in testbus to find out which device was removed. Calling this
122 * function returns a pointer to the device and then clears it back to NULL, so
123 * that a future test can check it.
125 struct udevice *testbus_get_clear_removed(void);
127 static inline void arch_reset_for_test(void)
129 #ifdef CONFIG_SANDBOX
130 #include <asm/state.h>
132 state_reset_for_test(state_get_current());
136 #endif /* __TEST_TEST_H */